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IAR Embedded Workbench for Arm 9.70.x

Selecting a time interval for profiling information

In this section:

Normally, the profiler computes its information from all PC samples it receives, accumulating more and more information until you explicitly clear the profiling information. However, you can choose a time interval for which the profiler computes the PC samples. This function is supported by the I-jet and I-jet Trace in-circuit debugging probes, the J-Link probe, the J-Trace probe, the ST-LINK probe, and the TI XDS probe.

To select a time interval:

  1. Choose Function Profiler from the C-SPY driver menu.

  2. In the Function Profiler window, right-click and choose Source: Sampling from the context menu.

  3. Execute your application to collect samples.

  4. Choose Driver>Timeline.

  5. In the Timeline window, click and drag to select a time interval.

    PowerGraphWithSelection_2.png

  6. In the selected time interval, right-click and choose Profile Selection from the context menu.

    The Function Profiler window now displays profiling information for the selected time interval.

    FunctionProfilerWithTimeInterval_Mym85_02_target.png

  7. Click ProfilingModeButton.pngthe Full/Time-interval profiling button to toggle the Full profiling view.